Versão em Português                                  Topics   XVIII  TC04 IMEKO Symposium and IX Semetro

METROLOGY

Besides the topics below the Congress will have a special session dedicated to Microelectronic Metrology.

  1. Software, automation, validation and productivity in electrical metrology;
  2. Standards, calibration, metrology, techniques, methods and measurement procedures;
  3. Quality management in test and calibration laboratories;
  4. Quantum metrology and fundamental constants;
  5. Remote and virtual calibration and measurement systems;
  6. New Technologies applied in electrical metrology;
  7. Traceability, international compatibility of measurements
  8. Electrical metrology in the areas of health, environmental and telecommunications;
  9. Mathematical and statistical tools for metrology;
  10. Time and frequency measurements;
  11. Direct Current and Low Frequency Measurements;
  12. RadioFrequency, Microwave and Millimeter Wave Measurements;
  13. OpticalWavelength Metrology;
  14. Digital and Mixed Signal Processing;
  15. Waveform Analysis and Measurement;
  16. EMC Measurements;
  17. Power and Energy Measurements;
  18. Power Quality Assessment;
  19. Measurement for System Identification and Control;
  20. E-learning and Education in Measurements;
  21. Smart Grid.


    22. INSTRUMENTATION

  22. Measurement of electrical quantities;
  23. Measurement related with electrical quantities;
  24. Education in instrumentation and measurement;
  25. Analog and mixed signal processing for measurement;
  26. Measurement applications;
  27. Sensors and transducers;
  28. A/D and D/A converters;
  29. Biomedical Instrumentation;
  30. Analysis and modeling of measurement systems;
  31. Advanced Instrumentation Based on Micro and Nano Technologies;
  32. E-learning and Education in Instrumentation